Single Solder Ball Impact Tester
A test apparatus applies high speed impact load to a sample to test the shear strength of attachment of a component part to the sample by use of a rotary drive mechanism driving an impact tip. A support mechanism provides alignment between the impact tip and a portion of the sample to receive a test force and prevents relative movement of at least one of the sample and the impact tip. The rotary drive mechanism establishes a impact force between the impact tip and the sample and a force transducer receives the resultant force and providing a corresponding output. In one example the force transducer uses a piezoelectric film for sensing. The testing may be used for example to provide stable impact speed to a solder ball and provide as an output a force and displacement relationship curve. The stable speed can be acquired by clutch and the data collection.
Countries or Regions:
US
Invention Code:
IP.PA.00361
Contact Us:
okt@ust.hk
Authors:
Key Features:
Specification:
Category:
TAP - Microelectronics
Reference:
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